Tutorials

Explore our comprehensive library of videos and tutorials designed to help you get the most out of our products. From in-depth technical guides to quick setup demonstrations, our video collection covers essential topics for beginners and experts alike.

Company Overview Videos


Microsanj - Introduction

Microsanj is a global leader in high-resolution thermal imaging solutions, delivering cutting-edge thermoreflectance and infrared (IR+TR) technology to advance semiconductor testing, RF analysis, and materials research.


Microsanj Advanced Thermal Imaging

Microsanj provides high-resolution, non-invasive thermal analysis for 5G, AI, automotive, and semiconductor industries. Our technology surpasses traditional IR thermography with transient thermal response analysis and 2D/3D thermal mapping.


Microsanj Technology Overview

Discover how Microsanj’s advanced thermoreflectance technology enables high-resolution thermal analysis for semiconductor devices. 


17 Years of Innovation in Thermal Imaging

For over 17 years, Microsanj has led high-resolution thermal imaging for RF, microwave, and millimeter-wave applications. Our thermoreflectance-based technology enables precise, non-invasive thermal analysis for advanced semiconductor testing.


Microsanj - The Future of Thermal Imaging

Microsanj offers thermoreflectance-based thermal imaging solutions for microelectronics, GaN, HEMT, and automotive industries. Our technology provides high-resolution, non-invasive thermal analysis for precise device characterization.


Thermal Capabilities Videos


IC Latch-Up at 2ms, 5.4V, 150mA

Microsanj’s thermal imaging solutions detect transient thermal events in ICs, providing real-time insights for failure analysis, device validation, and reliability optimization.


Failure Analysis Tutorial MT120 

This tutorial highlights the MT120 thermal imaging system for detecting and diagnosing semiconductor failures. With submicron spatial resolution and fast transient analysis, the MT120 is ideal for failure analysis, hotspot detection, and reliability testing.


GaN Analysis with
NT220

The NT220 System delivers high-precision thermal imaging for GaN HEMT, MMIC, and RF devices. Using thermoreflectance-based technology, it provides submicron spatial resolution and transient thermal analysis for hotspot detection and failure analysis.


Locating a defect in a silicon diode

The NT110 System enables sub-micron spatial resolution for detecting semiconductor defects. Using near-infrared and visible light, it accurately locates shorts and thermal anomalies in silicon diodes and other semiconductor devices.


Chip-Package-PCB-Antenna OTA Testing

Microsanj’s OTA testing solution integrates thermal imaging with RF/mmWave analysis, enabling real-time, high-resolution thermal characterization from chip to antenna.


GaN HEMT Transient Thermal Imaging 

Microsanj’s thermal imaging system provides nanoscale transient thermal analysis of GaN HEMT devices, capturing real-time thermal events to enhance reliability and efficiency.


Microsanj Heater Green Demonstration

The Microsanj Heater Green system, paired with the TRX 005X, offers high-speed thermal characterization with a 100µs transient response and 530nm imaging.


Transient Latch-Up
Analysis

Microsanj’s transient latch-up analysis captures high-speed thermal events with exceptional clarity, enabling precise characterization of failure mechanisms.


Nanoscale & Ultrafast Thermal Imaging of GaN RF Devices

Microsanj’s thermal imaging technology enables nanoscale, ultrafast characterization of GaN RF devices for optimizing performance and reliability.


Product Videos


Unveiling the Invisible

Microsanj’s EZ510 and NT220 systems go beyond traditional IR imaging, providing sub-300nm resolution for precise GaN device analysis. The EZ510 offers 5µs response time for steady-state mapping, while the NT220 excels in transient thermal analysis. Both integrate seamlessly with probe stations and accessories.


Getting Started with the Microsanj NT220

A step-by-step guide to setting up and operating the NanoTHERM NT220 for high-precision thermal analysis. Learn about biasing, LED selection, calibration, and real-time thermal imaging using both thermoreflectance and IR techniques.


Microsanj - EZ500

Explore Microsanj’s thermoreflectance-based thermal imaging solutions, providing critical spatial, temporal, and thermal insights. See a live demonstration of its key components and real-time thermal overlay capabilities.


Product Summary: NanoTHERM & PicoTHERM Series

Explore Microsanj’s thermoreflectance-based thermal imaging solutions, providing critical spatial, temporal, and thermal insights. See a live demonstration of its key components and real-time thermal overlay capabilities.


EZ-THERM Product Announcement

Introducing the EZ-THERM Series, a cost-effective, modular thermal imaging solution for failure analysis and thermal profiling. Featuring the EZ500A controller, it supports both thermoreflectance and IR imaging, integrating easily with existing test setups.


System Overview by Signal Path

See Microsanj’s thermal reflectance technology in action, enabling ultra-precise thermal analysis with optical-level resolution. Capture sub-nanosecond thermal events and visualize heat flow in semiconductor devices with millikelvin sensitivity.


Event Videos


IMS 2024 Booth Tour: NT220 & EZ-THERM Systems Showcase

Microsanj showcases NT220 and EZ-THERM systems at IMS 2024, featuring high-speed, high-resolution thermal analysis. These solutions offer 0.1°C accuracy and 250nm spatial resolution for materials, ICs, and electronics.


IMS 2024 MicroApps Presentation

Watch Mo Shakouri and Sidina Wane’s IMS 2024 presentation on thermal analysis and the OTA electromagnetic characterization of GaN and MMIC devices. Learn cutting-edge techniques for improving performance, reliability, and efficiency in advanced microwave systems.


Hybridization of GaN & GaAs in a Single Package System

Microsanj’s GaN-GaAs system-in-package offers 27 dBm power and real-time thermal profiling. Operating from 24-30 GHz, it supports 5G, OFDM, and dynamic range applications with ultra-low noise.


Disruptive Test Solutions for Peak Performance

eV-Technologies and Microsanj showcase hybridized GaN-GaAs test solutions for millimeter-wave devices. This innovation optimizes thermal dissipation and energy conversion at high power levels.


Thermal Measurement Across IR to UV Spectrums

Microsanj’s thermal imaging system delivers precise temperature mapping using thermoreflectance from IR to UV, ideal for micro/nanoelectronics and high-sensitivity thermal analysis.


Full-Field Transient Thermal Imaging for 3D IC Metrology

Presented at EPTC 2023, this talk covers NF OTA testing and SCO coatings for thermal management in miniaturized, high-frequency devices.


Microsanj at InterPACK 2023

Microsanj’s thermoreflectance technology enables precise thermal mapping for semiconductor packaging, RF, and microwave applications.


Thermal & Electromagnetic Analysis of Microwave Devices

Microsanj and eV Technologies demonstrate thermal-electromagnetic testing for high-performance microwave systems, improving device efficiency and reliability.


Microsanj & MPI Corporation AST at IMS 2023

See MPI’s automated probe station at IMS 2024, now with Microsanj’s thermoreflectance imaging. This system offers wafer-level temperature compensation, high-frequency probing, and optical-resolution thermal mapping, delivering precise and efficient device testing.