The irFLASH™ system is a cutting-edge lock-in infrared thermography solution designed for thermal characterization, defect detection, and material analysis in semiconductors, photonics, and power electronics. With its high-sensitivity infrared imaging and lock-in techniques, irFLASH™ provides unmatched precision for real-time thermal diagnostics.

• Lock-In Infrared Thermography – High-precision detection of thermal anomalies and material inconsistencies.
• Ultra-Sensitive Thermal Mapping – Capture subsurface defects and temperature variations.
• Non-Destructive Testing – Analyze devices and materials without physical interference.
• Advanced Multi-Layer Analysis – Evaluate thermal behavior in complex semiconductor and photonics structures.
• Seamless Integration with Semiconductor & RF Testing – Compatible with load pull, on-wafer RF, and pulse-IV analysis.

• Semiconductor & IC Analysis – Detect hidden defects and material inconsistencies.
• Power Electronics & Circuit Boards – Assess heat flow in GaN, SiC, and IGBT components.
• Photonics & Optoelectronics – Evaluate thermal dissipation in LEDs, waveguides, and laser diodes.
• Material Science & Thin-Film Research – Study thermal conductivity in advanced materials.

• Infrared Imaging Technology: Lock-in thermography for enhanced defect detection
• Thermal Sensitivity: High-resolution imaging for fine-structure analysis
• Measurement Techniques: Non-invasive, real-time thermal diagnostics
• Software Compatibility: Fully integrated with SanjVIEW™ for advanced data analysis