Ultrafast Thermal Characterization System
PicoSCOPE™
High-Speed, High-Resolution Thermal Analysis
The PicoSCOPE™ is a state-of-the-art thermal imaging system designed for ultrafast transient thermal analysis in semiconductors, RF devices, and optoelectronics. With 500-picosecond temporal resolution, PicoSCOPE™ provides unmatched precision for capturing rapid thermal events and ensuring device reliability.
Key Features & Benefits
- 500-Picosecond Temporal Resolution – Capture extremely fast transient thermal events.
- Sub-Micron Spatial Resolution – Detailed thermal mapping for microscale device analysis
- Non-Destructive, High-Sensitivity Imaging – Ideal for failure analysis and reliability testing.
- Seamless Integration with Semiconductor Testing Systems – Optimized for RF, photonics, and power electronics applications.
- Advanced Heat Dissipation Analysis – Detect hotspots and thermal anomalies in high-performance components.
Applications
- Semiconductor & IC Testing – Analyze thermal response in high-speed devices.
- RF & 5G Device Optimization – Optimize thermal behavior of power amplifiers and antennas.
- Failure Analysis & Reliability Testing – Ensure long-term stability in critical electronic components.
- Power Electronics & PCB Analysis – Evaluate thermal impact in laser diodes, waveguides, and LEDs.
Technical Specifications
- Temporal Resolution: 500 picoseconds
- Spatial Resolution: Sub-micron precision
- Measurement Techniques: High-speed thermal imaging
- Software Compatibility: Fully integrated with SanjVIEW™ for real-time diagnostics
Why Choose PicoSCOPE™?
As the leading ultrafast thermal imaging solution, PicoSCOPE™ delivers exceptional speed and accuracy for capturing rapid heat dissipation events in next-generation semiconductor and RF applications. Whether for failure analysis, performance optimization, or cutting-edge research, this system provides the insights needed to enhance thermal management and device reliability.
Contact Microsanj to Learn More or Request a Demo!