SanjVIEW™ is Microsanj’s powerful thermal imaging and analysis software, designed to provide high-resolution, real-time visualization of temperature distributions. Whether you're conducting failure analysis, device characterization, or advanced research, SanjVIEW™ delivers precise thermal data with an intuitive, user-friendly interface.

• Real-Time Thermal Imaging – Capture, process, and analyze thermal data in real-time with high-speed visualization
• Advanced Data Analytics – Extract precise temperature profiles, transient thermal responses, and hot spot tracking.
• High-Resolution Image Processing – Supports sub-micron spatial resolution for detailed thermal mapping.
• Multi-Device Integration – Seamlessly works with SanjSCOPE™ Thermoreflectance Systems, irSCOPE™ Infrared Systems, and other Microsanj products.
• Automated Reporting & Export – Generate professional thermal analysis reports and export data in multiple formats.
• User-Friendly Interface – Designed for researchers and engineers, featuring an intuitive layout and customizable workflows.

• Semiconductor Thermal Testing – Analyze ICs, transistors, and advanced packaging.
• RF & 5G Device Characterization – Evaluate high-frequency power amplifiers and phased arrays.
• Failure Analysis & Reliability Testing – Detect hot spots, thermal-induced failures, and electromigration.
• Power Electronics & AI Computing – Optimize thermal management in GaN, SiC, and AI accelerator chips.