Time-Domain Thermoreflectance (TDTR)

Time-Domain Thermoreflectance (TDTR) is a laser-based thermal measurement technique used to accurately determine the thermal conductivity and interfacial resistance of thin films and bulk materials. By using ultrafast laser pulses, TDTR provides high-precision, non-contact thermal analysis crucial for material science, semiconductor development, and advanced electronics research.

TDTR uses a modulated laser pump to heat the material and a probe laser to measure changes in reflectivity caused by temperature variations. This technique allows researchers to extract key thermal properties, including:

• Thermal Conductivity – How well a material conducts heat.
• Thermal Diffusivity – The rate at which heat spreads through a material.
• Interface Thermal Resistance – The thermal barrier between different layers in multi-layer structures.

• Non-Destructive Testing – Analyze materials without altering their properties.
• High-Resolution Thermal Analysis – Characterize sub-micron thin films and nanostructures.
• Multi-Layer System Compatibility – Ideal for 3DIC packaging, photonics, and semiconductor materials.
• Fast & Reliable Data Collection – Obtain real-time, accurate thermal measurements.
• Broad Material Compatibility – Suitable for metals, semiconductors, polymers, and advanced composites.

• Semiconductor Device & Packaging Analysis – Optimize thermal properties in high-performance electronics.
• Thermal Interface Materials (TIMs) Research – Evaluate heat dissipation efficiency in advanced materials.
• Photonics & Optoelectronics – Measure thermal performance in laser diodes, LEDs, and optical coatings.
• Material Science & Nanotechnology – Study thermal conductivity in emerging materials and nanostructures.