The EZ100A OpenTEST™ is a specialized infrared thermal imaging system designed for open circuit detection, failure analysis, and process integrity assessment in semiconductors, RF devices, and electronic components. With high-sensitivity IR detection, OpenTEST™ delivers precise, real-time failure diagnostics for R&D and manufacturing applications.

• Infrared-Based Fault Detection – Identify open circuits, thermal defects, and connectivity failures.
• High-Sensitivity Imaging – Pinpoint heat dissipation issues in microelectronics and PCB assemblies.
• Real-Time Analysis – Monitor thermal integrity and process variations efficiently.
• Non-Destructive Testing – Diagnose device failures without physical interference.
• Seamless Integration – Works with Microsanj’s SanjVIEW™ software for enhanced thermal diagnostics.

• Semiconductor Manufacturing – Detect hidden defects in ICs, MEMS, and microelectronics.
• RF & 5G Device Testing – Ensure reliable performance of high-frequency components.
• PCB & Circuit Analysis – Identify faulty solder joints, broken traces, and manufacturing defects.
• Power Electronics – Assess thermal stress and reliability in high-power devices.

• Infrared Sensitivity: High-precision detection for failure analysis
• Thermal Imaging Resolution: Optimized for electronic component diagnostics
• Software Compatibility: Compatible with Microsanj’s SanjVIEW™ software
• Compact & Portable Design: The perfect solution for busy lab enviornments