Combining Infrared & Thermoreflectance for Ultimate Thermal Analysis
IR+TR Hybrid System
Comprehensive Thermal Imaging for Advanced Device Analysis
The IR+TR Hybrid System combines infrared (IR) and thermoreflectance (TR) imaging to deliver unparalleled thermal characterization for semiconductors, RF devices, photonics, and power electronics. Integrating broad-spectrum infrared detection with high-resolution thermoreflectance imaging offers a complete thermal analysis solution for next-generation research and development.
Key Benefits of IR+TR Hybrid Technology
- Multi-Scale Thermal Analysis – From large-area heat dissipation to localized thermal events.
- Enhanced Failure Analysis – Detect hotspots, thermal stress, and material inconsistencies.
- Optimized for Semiconductor & RF Testing – Ideal for 5G/6G, power electronics, and multi-layer ICs.
- Seamless Integration – Fully compatible with Microsanj’s SanjVIEW™ software and industry-standard testing platforms.
Applications
- Semiconductor Packaging & IC Testing – Improve device reliability and heat dissipation strategies.
- RF & 5G/6G Device Characterization – Ensure efficient thermal management of antennas and power amplifiers.
- Photonics & Optoelectronics – Evaluate thermal properties in LEDs, laser diodes, and optical interconnects.
- Power Electronics & Advanced Materials – Study heat transfer in GaN, SiC, and novel material systems.
Technical Specifications
- Infrared Spatial Resolution: Microscale detection
- Thermoreflectance Spatial Resolution: 250nm
- Temporal Resolution: Nanosecond-scale transient analysis
- Software Compatibility: Fully integrated with SanjVIEW™ for advanced diagnostics
Why Choose the IR+TR Hybrid System?
The IR+TR Hybrid System offers the most comprehensive thermal imaging solution available, providing superior accuracy and flexibility for advanced research and engineering applications.
Contact Microsanj to Learn More or Request a Demo!