Introducing the PS700 POSH-TDTR System — Advancing Thermal Characterization for Modern Materials
Microsanj is proud to announce our latest breakthrough: the PS700 POSH-TDTR™ System.
Engineered for precision, the PS700 POSH-TDTR System empowers researchers and engineers to accurately determine anisotropic thermal properties of thin films and bulk materials—vital for next-generation electronics and advanced packaging. Leveraging our proprietary Picosecond Optical Sampling for Heat Transfer Analysis with the Time Domain Thermoreflectance (POSH-TDTR) technique, our system delivers high-resolution, rapid measurements without the need for mechanical delay lines.
Key Benefits:
- Measures thermal conductivity from <1 W/m-K to 1,000 W/m-K.
- Characterizes thin films as little as 10nm.
- Compatible with diverse materials: Si, SiC, GaAs, Diamond, and more.
- <2ms acquisition time and accurate, repeatable results.
- Embedded SanjTHERM™ software simplifies data acquisition and analysis.
Why it Matters:
With the rise of heterogeneous packaging and multi-layered devices, the ability to extract in-plane and cross-plane thermal properties is now essential. The PS700 delivers the insights you need to ensure both thermal and electrical integrity in cutting-edge applications.
Ready to learn more or schedule a demo?
Contact us today or visit our website for product details and technical specifications.