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EuMW 2025
European Microwave Week (EuMW) 2025 is Europe’s premier event dedicated to microwave, RF, wireless, and radar technologies. EuMW 2025 will feature three cutting-edge conferences, industry-led workshops, and a world-class exhibition showcasing the latest innovations in microwave and wireless engineering. The event brings together academics, researchers, and industry professionals to explore advancements in 5G/6G, automotive radar, IoT, aerospace, and defense applications, fostering collaboration and technological progress in the field. Microsanj will be exhibiting in Booth A140 and also with our partner, MPI Corporation, at Booth E046.
👉 Stay tuned for a big announcement from Microsanj during EuMW 2025!
📡 6G Forum
Date & Time: Monday, September 22 | 9:00 AM – 8:00 PM
Demo: RF Power + Loss Mapping
EZ-THERM System: Visualizing RF Power Dissipation & EM Field Distribution
What You’ll See:
Using the EZ-THERM system, we’ll visualize thermal patterns caused by current density and RF power dissipation on active transmission lines and RF components. You’ll observe how mismatches, losses, and radiation effects generate localized hot spots, highlighting areas of inefficiency or potential failure.
Why It Matters:
Thermal signatures provide insight into the electric field distribution and energy losses across your RF layout. This demo helps engineers correlate thermal and electrical behavior—essential for identifying design flaws, verifying simulations, and optimizing system reliability and performance.
Applications:
- 5G/6G RF Module & MMIC Testing
- Semiconductor Device Analysis
- Power Electronics Thermal Analysis
🔬 Microsanj Booth (A140)
Exhibition Opening Times:
- Tuesday, September 23: 9:30 AM – 6:00 PM
- Wednesday, September 24: 9:30 AM – 5:30 PM
- Thursday, September 25: 9:30 AM – 4:30 PM
🔧 Demo 1: High-Speed + High-Power GaN
EZ-THERM System Thermal Imaging
What You’ll See:
Watch the EZ500 in action as it captures live thermal behavior of a GaN device using our high-resolution, motorized probe station. Experience real-time, picosecond-level thermal imaging that reveals rapid junction temperature spikes and elusive hot spots invisible to traditional tools.
Why It Matters:
This is next-gen thermal analysis—ideal for engineers pushing GaN devices to their limits. With 250 nm spatial resolution and 500 ps temporal resolution, it uncovers hidden hot spots and rapid thermal events that traditional tools simply miss.
Applications:
- GaN Power Amplifier Testing
- High-Frequency Device Characterization
- TIM and Thermal Path Evaluation
- Failure Analysis & Process Integrity
- Electro-Thermal Modeling Support
🌡️ Demo 2: EZ-THERM Discovery Zone
Hands-On Open Platform for Real-Time Thermal Analysis
What You’ll See:
Interact directly with our EZ-THERM system on a CPS probe station. Test various materials, devices, and layouts with instant thermal feedback—no specialized setup needed. Features Lock-In, Flash Thermography, and Open Circuit Detection.
Why It Matters:
This is a fast, flexible tool for researchers, prototypers, and product developers. Measure thermal maps of full PCBs or zoom down to 4.8 μm resolution—all in under a minute.
Applications:
- Materials & Prototyping Research
- Thermal Characterization of Complex Layouts
- PCB and Chip-Level Analysis
- MEMS and Power IC Testing
📡 Demo 3: RF Power + Loss Mapping
EZ-THERM System: Visualizing RF Power Dissipation & EM Field Distribution
What You’ll See:
Using the EZ-THERM system, we’ll visualize thermal patterns caused by current density and RF power dissipation on active transmission lines and RF components. You’ll observe how mismatches, losses, and radiation effects generate localized hot spots, highlighting areas of inefficiency or potential failure.
Why It Matters:
Thermal signatures provide insight into the electric field distribution and energy losses across your RF layout. This demo helps engineers correlate thermal and electrical behavior—essential for identifying design flaws, verifying simulations, and optimizing system reliability and performance.
Applications:
- 5G/6G RF Module & MMIC Testing
- Semiconductor Device Analysis
- Power Electronics Thermal Analysis
🤝 MPI + Microsanj Joint Demo (E046)
Exhibition Opening Times:
- Tuesday, September 23: 9:30 AM – 6:00 PM
- Wednesday, September 24: 9:30 AM – 5:30 PM
- Thursday, September 25: 9:30 AM – 4:30 PM
📡 Demo 4: MPI Automated Probe + Microsanj Thermal Imaging
What You’ll See:
Experience an automated MPI probe station integrated with the Microsanj thermal microscope, enabling advanced thermal imaging for devices operating up to 250 GHz. Watch as high-speed, high-resolution analysis reveals hidden hot spots and thermal dynamics during active device operation.
Why It Matters:
This powerful combination delivers next-level insight for engineers working with cutting-edge RF and mmWave devices. With sub-micron spatial resolution and picosecond-level temporal response, it provides unmatched visibility into thermal behavior at extreme frequencies.
Applications:
- 5G/6G and mmWave Device Characterization
- High-Frequency GaN and GaAs Testing
- Reliability and Lifetime Prediction
- Advanced RF Module Development
- Electro-Thermal Modeling & Validation