Thank You, San Francisco!

IMS 2025 Was a Success — Thanks to You

To everyone who stopped by Booth #1159 at IMS 2025—thank you!

We were excited to meet so many engineers, researchers, and RF innovators. If you missed a demo or just want a quick recap, here’s what we showcased.

At IMS 2025, we showcased five cutting-edge live demos focused on high-speed, high-power, and high-frequency device analysis. 

• Demo 1 featured our PT500 system performing live Pulse IV testing on a GaN device with 250nm spatial and 500ps temporal resolution, revealing hidden hot spots—ideal for GaN power amp testing, TIM evaluation, and failure analysis. 
• Demo 2, the EZ-THERM Discovery Zone, allowed attendees to map PCB and material heat signatures in under a minute with no specialized setup, supporting PCB/chip analysis, MEMS testing, and materials R&D. 
• Demo 3 used our EZ530 system integrated with an MPI RF probe station to provide real-time thermoreflectance and IR imaging of active RF devices under realistic operating conditions—perfect for MMIC testing, antenna optimization, and reliability studies. 
• Demo 4 leveraged EZ-THERM to visualize RF power dissipation and current density, helping engineers identify inefficiencies in RF design, power electronics, and substrate mapping. 
• Demo 5 was a joint demonstration with Focus Microwave that synchronized tri-state Pulse IV with high-speed thermal imaging to capture sub-50ns junction temperature shifts, offering valuable insights for load-pull testing, pulsed device behavior, and electro-thermal optimization. 

A Huge Congratulations to our Amazon Gift Card Raffle Winners!