4D Thermal Characterization of Advanced Devices
Analyze static & time-dependent thermal behavior of active devices.
<250 nm Spatial resolution
800 ps Transient response
0.1 ⁰C Thermal resolution
Full field thermal images
Pixel by pixel calibration
VisibleIR: Dual Mode IR + TR
<15 mK Sensitivity in IR Mode
User-Friendly SanjVIEW™ Operating system
Applicable for …
GaN RF & 5G devices
Neuromorphic devices
Phase change materials
High speed logic ICs
Ultra-wide bandgap devices
ESD devices
Photo cells, etc.
Get thermal results for …
Thermal modeling
Thermal design verification
Performance
Optimization
Process monitoring
Heat sink integrity
Quality assurance & failure analysis
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June 2017
Microsanj is awarded best Paper award by IEEE ITHERM 2017 for joint paper with Western Digital, University of Illinois and Purdue University. Paper: “Accurate Thermoreflectance Imaging of Nano-Features Using Thermal Decay”
IEEE ITHERM 2017 / Read Full Article
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