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DTSTART;TZID=America/Chicago:20260910T090000
DTEND;TZID=America/Chicago:20260910T160000
DTSTAMP:20260805T142924Z
CREATED:20260731T183621Z
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SUMMARY:Advanced Semiconductor & Photonics Characterization Forum
DESCRIPTION:The Advanced Semiconductor Characterization Forum – Southwest is a free\, full-day in-person event on Thursday\, September 10\, 2026\, from 9:00 AM to 4:00 PM MT at the National Museum of Nuclear Science & History in Albuquerque\, NM (lunch and parking included). Co-hosted by Microsanj\, Keysight\, MPI Corporation\, Focus Microwaves\, and Gel Pak\, it brings together the quantum computing and semiconductor engineering communities across New Mexico and the Southwest for a morning of technical presentations covering RF\, photonics\, materials characterization\, and wide-bandgap devices\, followed by hands-on afternoon demo stations and a free museum tour.\nSpeakers include: \n\nLawrence Vandervegt (MPI Corporation) on scaling electro-optical component testing from R&D to high-volume manufacturing.\nSajjad Ahmed (Focus Microwaves) on advances in large-signal\, DC\, and noise-parameter RF measurement.\nDustin Kendig (Microsanj) on full-field thermoreflectance and multiphysics characterization of GaN and wide-bandgap RF devices.\nPlus sessions from Keysight and Gel Pak (Jim Portugal).\n\nApplication engineers will be on site all day\, making it a practical opportunity for RF engineers\, device researchers\, and test & measurement professionals to see the full characterization workflow in one place. \nRegister Now
URL:https://microsanj.com/events/advanced-semiconductor-photonics-characterization-forum/
LOCATION:Nuclear Science & History Museum\, 601 Eubank Blvd SE\, Albuquerque\, NM\, 87123\, United States
CATEGORIES:Workshop
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