BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Microsanj - ECPv6.18.3.1//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-ORIGINAL-URL:https://microsanj.com
X-WR-CALDESC:Events for Microsanj
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:UTC
BEGIN:STANDARD
TZOFFSETFROM:+0000
TZOFFSETTO:+0000
TZNAME:UTC
DTSTART:20250101T000000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;VALUE=DATE:20260527
DTEND;VALUE=DATE:20260528
DTSTAMP:20260514T141831Z
CREATED:20260429T201814Z
LAST-MODIFIED:20260514T141831Z
UID:2097-1779840000-1779926399@microsanj.com
SUMMARY:Multiphysics Characterization of GaN and Wide‑Bandgap RF Devices: Correlating Pulsed‑IV\, RF\, and Thermoreflectance Thermal Imaging Measurements (Technical Webinar)
DESCRIPTION:Exploring how multiphysics approaches are unlocking new understanding of GaN\, SiC\, and next-generation semiconductor devices.\n\n\n\n\n\nEvent Details\n\n 	Date: Wednesday\, May 27\, 2026\n 	Location: Virtual\n 	Time: 7:00 AM - 8:00 AM PDT & 7:00 PM - 8:00 PM PDT\n\n\n\n\nLearn More & Register Now
URL:https://microsanj.com/events/technical-webinar-may-27-2026-multiphysics-characterization-of-gan-and-wide-bandgap-rf-devices-correlating-pulsed-iv-rf-and-thermoreflectance-thermal-imaging-measurement/
LOCATION:Virtual
CATEGORIES:Webinar
ATTACH;FMTTYPE=image/png:https://microsanj.com/wp-content/uploads/2026/04/Webinar-Social-Media-Image-e1777493935499.png
END:VEVENT
END:VCALENDAR