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X-WR-CALDESC:Events for Microsanj
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DTSTART;VALUE=DATE:20250615
DTEND;VALUE=DATE:20250621
DTSTAMP:20250612T144410Z
CREATED:20250207T220036Z
LAST-MODIFIED:20250612T144410Z
UID:290-1749945600-1750463999@microsanj.com
SUMMARY:IMS 2025
DESCRIPTION:IMS 2025 (IEEE MTT-S International Microwave Symposium) is the premier global event for professionals in the RF\, microwave\, and millimeter-wave industries. IMS 2025 will feature technical sessions\, workshops\, panel discussions\, and an expansive exhibition showcasing the latest innovations in wireless technology\, radar\, 5G/6G\, automotive\, and more. The symposium brings together engineers\, researchers\, and industry leaders to share advancements\, explore emerging trends\, and foster collaborations in the field of microwave and RF engineering. \n\n\n\nMicrosanj will exhibit at Booth #1159 at IMS 2025 in San Francisco\, CA! Visit us at Booth 1159 to experience live demonstrations\, speak with Microsanj experts about your thermal challenges and how our tools can help optimize your designs\, and receive exclusive giveaways. \nView Floorplan \nRegister with our customer code: 824 \n\nLive Demos You’ll See At Our Booth: \n🔧 Demo 1: High-Speed + High-Power GaN \nPT500 Flagship Thermal Imaging Demo\n📍 Booth #1159 \nWhat You’ll See:\nWatch the PT500 in action as it performs a live Pulse IV test on a GaN device using our high-resolution\, motorized probe station. Witness real-time\, picosecond-level thermal imaging that reveals rapid junction temperature spikes and elusive hot spots invisible to traditional tools. \nWhy It Matters:\nThis is next-gen thermal analysis—ideal for engineers pushing GaN devices to their limits. With 250nm spatial resolution and 500 picosecond temporal resolution\, it reveals hidden hot spots and rapid thermal events that traditional tools simply miss. \nApplications: \n\nGaN Power Amplifier Testing\nHigh-Frequency Device Characterization\nTIM and Thermal Path Evaluation\nFailure Analysis & Process Integrity\nElectro-Thermal Modeling Support\n\n  \n🌡️ Demo 2: EZ-THERM Discovery Zone \nHands-On Open Platform for Real-Time Thermal Analysis\n📍 Booth #1159 \nWhat You’ll See:\nInteract directly with our EZ-THERM system on a CPS probe station. Test various materials\, devices\, and layouts with instant thermal feedback—no specialized setup needed. Features Lock-In\, Flash Thermography\, and Open Circuit Detection. \nWhy It Matters:\nThis is a fast\, flexible tool for researchers\, prototypers\, and product developers. Measure thermal maps of full PCBs or zoom down to 4.8 μm resolution—all in under a minute. \nApplications: \n\nMaterials & Prototyping Research\nThermal Characterization of Complex Layouts\nPCB and Chip-Level Analysis\nMEMS and Power IC Testing\n\n📡 Demo 3: RF in Focus \nEZ530 + MPI Probe Station for RF Imaging\n📍 Booth #1159 \nWhat You’ll See:\nOur EZ530 system integrates with an MPI RF probe station to deliver real-time\, non-contact thermoreflectance and IR imaging of active RF components—under realistic operating conditions. \nWhy It Matters:\nPerfect for 5G/6G developers and MMIC designers. Spot thermal failures\, validate simulations\, and optimize layouts with precision. \nApplications: \n\n5G/6G RF Module & MMIC Testing\nSubstrate-Level Thermal Path Mapping\nAntenna & Power Density Optimization\nElectro-Thermal Reliability Studies\n\n  \n📡 Demo 4: RF Power + Loss Mapping\nEZ-THERM System: Visualizing RF Power Dissipation & EM Field Distribution\n📍 Booth #1159 \nWhat You’ll See:\nUsing the EZ-THERM system\, we’ll visualize thermal patterns caused by current density and RF power dissipation on active transmission lines and RF components. You’ll observe how mismatches\, losses\, and radiation effects generate localized hot spots\, highlighting areas of inefficiency or potential failure. \nWhy It Matters:\nThermal signatures provide insight into the electric field distribution and energy losses across your RF layout. This demo helps engineers correlate thermal and electrical behavior—essential for identifying design flaws\, verifying simulations\, and optimizing system reliability and performance. \nApplications:\n• 5G/6G RF Module & MMIC Testing\n• Semiconductor Device Analysis\n• Power Electronics Thermal Analysis \n⚡ Demo 5: Pulse Sync (with Focus Microwave) \nJoint Electro-Thermal Demo with Focus Microwave\n📍 Focus Microwave Booth #659 \nWhat You’ll See:\nThis live demo synchronizes tri-state Pulse IV measurements from Focus Microwave with Microsanj’s high-speed thermal imaging. View dynamic junction temperature shifts in real time—capturing thermal transients as fast as 50ns with our NT220 system. \nWhy It Matters:\nAn advanced look at electro-thermal behavior in GaN devices under pulsed stress. For engineers working on high-power\, high-frequency systems. \nApplications: \n\nLoad-Pull with Thermal Feedback\nPulsed RF Device Stress Testing\nGaN and Power Amp Optimization\nTransient Junction Temperature Profiling\n\n🚨 Demo 6: Next-Gen Public Safety Comms \nWhat You’ll See:\nExperience real-time FirstNet interoperability with a standalone Band 14 Software Defined Radio (SDR) system\, connected to 5G SA-compliant user equipment. The demo also features mission-critical push-to-talk (MCPTT) and LMR interfacing. Plus\, get a firsthand look at our latest innovation—the 44D-LX Digital/Analog Broadband Wattmeter—engineered for precision RF measurement in public safety applications. \nWhy It Matters:\nReliable\, interoperable\, and measurable communication systems are critical. This demo highlights how emerging SDR platforms and advanced RF metering can support the future of public safety. \nApplications: \n\nFirst Responder & Public Safety Networks\nBand 14/FirstNet Device Development\nLMR–LTE/5G Integration\nRF System Performance Monitoring\nMission-Critical Communications\n\n\n🎤 Don’t Miss These Presentations\nAli Shakouri (Purdue University) will be presenting:“Acoustics Meets Quantum: Bridging RF Acoustics and Quantum Technologies”📅 Monday\, June 16🕗 8:00 AM – 5:20 PM📍 Room 208 \nGeorge Pavlidis (University of Connecticut) will be presenting:“Thermal Dynamics in Low-Thermally Conductive Ultra-Wide Bandgap”📅 Monday\, June 16🕗 8:00 AM – 5:20 PM📍 Room 307 \nView Paper Here \n\n🗓 EXHIBIT HALL HOURS \n\nTuesday\, June 17: 9:30 AM – 5:00 PM\nWednesday\, June 18: 9:30 AM – 6:00 PM\nThursday\, June 19: 9:30 AM – 3:00 PM\n\n\n🎁 FREE GIVEAWAYS & EXPERT INSIGHTSPlease stop by for free giveaways\, a chance to win an Amazon gift card\, and connect with our team to learn how Microsanj’s thermoreflectance technology can help you tackle real-world thermal and RF challenges. \n 
URL:https://microsanj.com/events/ims-2025/
LOCATION:Moscone Center\, 747 Howard St\, San Francisco\, CA\, 94103\, United States
CATEGORIES:Trade Shows
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